Microprobe Analysis
A new procedure for relocating mineral grains for microprobe
analysis.
A.G. Tindle and P.J. Potts
Most
recent work has focused on feature relocation. Several techniques
have been evaluated to locate minerals in polished thin sections
prior to microprobe analysis. The techniques under consideration
include beta autoradiography, X-ray excited optical luminescence
and uv excited optical luminescence. Specific mineral(s) respond
to each of these techniques enabling their rapid relocation prior
to probe analysis. This work has been resulted in the development
of a computer-based relocation procedure in which a digital image
of the sample is used as a 'map' to relocate visible features
on the sample mounted on the microprobe specimen stage.
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