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Dr Tony Nixon

Profile summary

  • Central Academic Staff
  • Senior Lecturer in Information Systems
  • Faculty of Science, Technology, Engineering & Mathematics
  • School of Engineering & Innovation
  • tony.nixon

Professional biography

Senior Lecturer in Information Systems: BSc (Physics) DPhil (Physics) M.Inst.P.

Currently authoring T194 (and soon T272)

Module team member on T276 and T885.

Previously: author on T276, Module team production chair on TM129.

Other skills/activities include teaching Advanced Engineering Mathematics to 2nd Year (Level 5) students..

Head of Systems Group 2006/7

Technology Staff Tutor 1994-2002

Research interests

Surface Science

XPS X-ray Photoelectron Spectrosopy

EELs Electron Energy Loss Spectroscopy

IAES Ion Induced Auger Electron Spectroscopy

Teaching interests

Mathematics for Engineers


X-ray radiation of poly-L-arginine hydrochloride and multilayered DNA-coatings (2014-11-03)
Stypczynska, Agnieszka; Nixon, Tony and Mason, Nigel
European Physical Journal D, 68, Article 333(11)
Surface activation for low temperature wafer fusion bonding by radicals produced in an oxygen discharge (2009-10)
Kowal, J.; Nixon, T.; Aitken, N. and Braithwaite, N. St. J.
Sensors and Actuators A: Physical, 155(1) (pp. 145-151)
Team project work for distance learners in engineering – challenges and benefits (2008-10)
Endean, Mark; Weidmann, George; , ; , and ,
Engineering Education, 3(2) (pp. 11-20)
X-ray induced damage in DNA monitored by X-ray photoelectron spectroscopy (2008-08-11)
Ptasińska, Sylwia; Stypczynska, Agnieszka; Nixon, Tony; Mason, Nigel; Klyachko, DV and Sanche, L
Journal of Chemical Physics, 129(6) (pp. 129-134)
Influence of Nanostructures in Perovskite Solar Cells (2016)
Ghosh, P.; Sundaram, S.; Nixon, T. and Krishnamurthy, S.
In: Hashmi, M.S.J. ed. Reference Module in Materials Science and Materials Engineering
ISBN : 978-0-12-803581-8 | Publisher : Elsevier
Quantum information (2011-04-11)
Nixon, Tony
In: Ramage, Magnus and Chapman, David eds. Perspectives in Information. Routledge Studies in Library and Information Science (pp. 121-133)
ISBN : 978-0-415-88410-5 | Publisher : Routledge | Published : Abingdon, UK and New York, USA